Laser Diode Characterization  
   

LIV and Wavelength plots of Semiconductor Laser Diode (simulated)

Sample plots from laser diode characterization system. It was built for testing lasers used in telecom applications. The test system was designed with fast data acquisition capabilities to facilitate quick turn around for LIV test with hundreds of data points. Fine current steps were necessary to perform kink analysis to meet telecom industry requirements.

Different systems were capable of testing multiple diodes on submounts/carriers or a laser diode in a butterfly package. Project involved complete electronic assembly, design and fabrication of custom photodiode amplifiers, system integration and custom software per customer and industry specifications.