|
|
Sample plots from laser diode
characterization system. It was built for testing lasers
used in telecom applications. The test system was
designed with fast data acquisition capabilities to
facilitate quick turn around for LIV test with hundreds
of data points. Fine current steps were necessary to
perform kink analysis to meet telecom industry
requirements.
Different systems were capable of
testing multiple diodes on submounts/carriers or a laser
diode in a butterfly package. Project involved complete
electronic assembly, design and fabrication of custom
photodiode amplifiers, system integration and custom
software per customer and industry specifications.
|